Structural and Electrical Characterization of Amorphous and Crystalline Manganese Oxide Thin Films Deposited by DC Magnetron Sputtering

David H. Olson, Kenneth D. Shaughnessy, Emma G. Langford, Michael Boyle, Muhammad Haider, David Lawrence, Costel Constantin

Research output: Contribution to journalJournal articlepeer-review

1 Scopus citations

Abstract

The environmental impact resulting from the use of fossil fuel as an energy source affects the entire globe. Eventually, fossil fuels will no longer be a reasonable source of energy and alternative energy sources will be needed. Thermoelectric materials (TE) that directly convert heat into electricity are a viable option to replace the conventional fossil fuel because they are reliable, cost effective, and use no moving parts. Recently researchers discovered the existence of giant Seebeck coefficient in manganese oxide (MnO2) powders, which ignited an increased interest in MnO2-based materials. In this work we present a systematic structural and electrical characterization of amorphous and crystalline MnxOy thin films. These films were deposited at room temperature on heated silicon and sapphire substrates by DC Magnetron Sputtering. Our preliminary results show that MnxOy/silicon thin films undergo a crystalline change from Mn2O3 to Mn3O4 as annealing temperature is increased from 300°C to 500°C.

Original languageEnglish
Pages (from-to)3929-3934
Number of pages6
JournalMRS Advances
Volume1
Issue number60
DOIs
StatePublished - 2016

Keywords

  • crystallographic structure
  • electrical properties
  • oxide

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