Single-chip CMOS analog sensor-conditioning ICs with integrated electrically-adjustable passive resistors

Leslie Landsberger, Oleg Grudin, Saed Salman, Tommy Tsang, Gennadiy Frolov, Zhengrong Huang, Mathieu Renaud, Bowei Zhang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Single-chip analog sensor-conditioning circuits with integrated electrically adjustable passive resistors allow adjustments without the drawbacks of digital conditioning. Adding a rudimentary bulk-silicon cavity-etch to a standard 1μm CMOS process enables innovations for thermally isolated adjustable resistors. One circuit has a ±50% gain adjustment range, 0.1 % of full-scale output precision, ±500mV offset adjustment range and the other has further TC-Offset and TC-Gain adjustments.

Original languageEnglish
Title of host publication2008 IEEE International Solid State Circuits Conference - Digest of Technical Papers, ISSCC
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages586-638
Number of pages53
ISBN (Print)9781424420100
DOIs
StatePublished - 2008
Externally publishedYes
Event2008 IEEE International Solid State Circuits Conference, ISSCC - San Francisco, CA, United States
Duration: 3 Feb 20087 Feb 2008

Publication series

NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
Volume51

Conference

Conference2008 IEEE International Solid State Circuits Conference, ISSCC
Country/TerritoryUnited States
CitySan Francisco, CA
Period3/02/087/02/08

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